Jeffrey Glass

Publications

  • Ubnoske, SM; Raut, AS; Parker, CB; Glass, JT; Stoner, BR, Role of nanocrystalline domain size on the electrochemical double-layer capacitance of high edge density carbon nanostructures, MRS Communications, vol 5 no. 02 (2015), pp. 285-290 [10.1557/mrc.2015.13] [abs].
  • Sund, JB; Wolter, SD; Parker, CB; Natishan, PM; Glass, JT, Diamond for Biosensing: Electrochemical Detection of NOx Species with Thiol-Amine Functionalized Diamond, Journal of the Electrochemical Society, vol 162 no. 8 (2015), pp. B225-B229 [10.1149/2.0691508jes] [abs].
  • Brown, B; Cordova, IA; Parker, CB; Stoner, BR; Glass, JT, Optimization of Active Manganese Oxide Electrodeposits Using Graphenated Carbon Nanotube Electrodes for Supercapacitors, Chemistry of Materials, vol 27 no. 7 (2015), pp. 2430-2438 [10.1021/cm504519m] [abs].
  • Russell, ZE; Chen, EX; Amsden, JJ; Wolter, SD; Danell, RM; Parker, CB; Stoner, BR; Gehm, ME; Brady, DJ; Glass, JT, Two-dimensional aperture coding for magnetic sector mass spectrometry., Journal of The American Society for Mass Spectrometry, vol 26 no. 2 (2015), pp. 248-256 [10.1007/s13361-014-1051-4] [abs].
  • Cordova, IA; Peng, Q; Ferrall, IL; Rieth, AJ; Hoertz, PG; Glass, JT, Enhanced photoelectrochemical water oxidation via atomic layer deposition of TiO 2 on fluorine-doped tin oxide nanoparticle films, Nanoscale, vol 7 no. 18 (2015), pp. 8584-8592 [10.1039/C4NR07377K] [abs].
  • Henry, PA; Raut, AS; Ubnoske, SM; Parker, CB; Glass, JT, Enhanced electron transfer kinetics through hybrid graphene-carbon nanotube films., Electrochemistry Communications, vol 48 (2014), pp. 103-106 [10.1016/j.elecom.2014.08.024] [abs].
  • Raut, AS; Cunningham, GB; Parker, CB; Klem, EJD; Stoner, BR; Deshusses, MA; Glass, JT, Disinfection of E. Coli Contaminated Urine Using Boron-Doped Diamond Electrodes, Journal of the Electrochemical Society, vol 161 no. 12 (2014), pp. G81-G85 [10.1149/2.1121410jes] [abs].
  • Chen, EX; Gehm, M; Danell, R; Wells, M; Glass, JT; Brady, D, Compressive mass analysis on quadrupole ion trap systems., Journal of The American Society for Mass Spectrometry, vol 25 no. 7 (2014), pp. 1295-1304 [10.1007/s13361-014-0894-z] [abs].
  • Ubnoske, SM; Raut, AS; Brown, B; Parker, CB; Stoner, BR; Glass, JT, Perspectives on the Growth of High Edge Density Carbon Nanostructures: Transitions from Vertically Oriented Graphene Nanosheets to Graphenated Carbon Nanotubes., The Journal of Physical Chemistry C, vol 118 no. 29 (2014), pp. 16126-16132 [10.1021/jp502317u] [abs].
  • Zhang, S; Kang, P; Ubnoske, S; Brennaman, MK; Song, N; House, RL; Glass, JT; Meyer, TJ, Polyethylenimine-Enhanced Electrocatalytic Reduction of CO 2 to Formate at Nitrogen-Doped Carbon Nanomaterials, Journal of the American Chemical Society, vol 136 no. 22 (2014), pp. 7845-7848 [10.1021/ja5031529] [abs].
  • Sund, JB; Causey, CP; Wolter, SD; Parker, CB; Stoner, BR; Toone, EJ; Glass, JT, Diamond surface functionalization with biomimicry – Amine surface tether and thiol moiety for electrochemical sensors, Applied Surface Science, vol 301 (2014), pp. 293-299 [10.1016/j.apsusc.2014.02.067] [abs].
  • Stoner, BR; Brown, B; Glass, JT, Selected topics on the synthesis, properties and applications of multiwalled carbon nanotubes, Diamond and Related Materials, vol 42 (2014), pp. 49-57 [10.1016/j.diamond.2013.12.003] [abs].
  • Gilchrist, KH; Piascik, JR; Stoner, BR; Radauscher, EJ; Amsden, JJ; Parker, CB; Glass, JT, Platform for integrated vacuum microelectronic circuits, IEEE International Vacuum Electronics Conference, IVEC 2014 (2014), pp. 155-156 [10.1109/IVEC.2014.6857536] [abs].
  • Peng, Q; Kalanyan, B; Hoertz, PG; Miller, A; Kim, D; Hanson, KG; Alibabaei, L; Liu, J; Meyer, TJ; Parsons, GN; Glass, JT, Core-shell photoelectrochemical electrodes for water splitting, Nanoscale Science and Engineering Forum 2013 - Core Programming Area at the 2013 AIChE Annual Meeting: Global Challenges for Engineering a Sustainable Future (2014) [abs].
  • Raut, AS; Cunningham, GB; Parker, CB; Klem, EJD; Stoner, BR; Deshusses, MA; Glass, JT, Electrochemical Disinfection of Human Urine for Water-Free and Additive-Free Toilets Using Boron-Doped Diamond Electrodes, ECS Transactions, vol 53 no. 17 (2013), pp. 1-11 [10.1149/05317.0001ecst] [abs].
  • Peng, Q; Kalanyan, B; Hoertz, PG; Miller, A; Kim, DOH; Hanson, K; Alibabaei, L; Liu, J; Meyer, TJ; Parsons, GN; Glass, JT, Solution-processed, antimony-doped tin oxide colloid films enable high-performance TiO2 photoanodes for water splitting., Nano Letters, vol 13 no. 4 (2013), pp. 1481-1488 [10.1021/nl3045525] [abs].
  • Peng, Q; Kalanyan, B; Hoertz, PG; Miller, A; Kim, D; Hanson, KG; Alibabaei, L; Liu, J; Meyer, TJ; Parsons, GN; Glass, JT; Peng, Q; Kalanyan, B; Hoertz, PG; Miller, A; Kim, D; Hanson, KG; Alibabaei, L; Liu, J; Meyer, TJ; Parsons, GN; Glass, JT, Core-shell photoelectrochemical electrodes for water splittingCore-shell photoelectrochemical electrodes for water splitting, Environmental Division 2013 - Core Programming Area at the 2013 AIChE Annual Meeting: Global Challenges for Engineering a Sustainable Future (2013) [abs].
  • Brown, B; Parker, CB; Stoner, BR; Grill, WM; Glass, JT, Electrochemical charge storage properties of vertically aligned carbon nanotube films: Effects of thermal oxidation, The Journal of Physical Chemistry C, vol 116 no. 36 (2012), pp. 19526-19534 [10.1021/jp304419a] [abs].
  • Madison, AC; Parker, CB; Glass, JT; Stoner, BR, Modeling operational modes of a bipolar vacuum microelectronic device, IEEE Electron Device Letters, vol 33 no. 10 (2012), pp. 1498-1500 [10.1109/LED.2012.2208445] [abs].
  • Parker, CB; Raut, AS; Brown, B; Stoner, BR; Glass, JT, Three-dimensional arrays of graphenated carbon nanotubes, Journal of materials research, vol 27 no. 7 (2012), pp. 1046-1053 [10.1557/jmr.2012.43] [abs].
  • Peng, Q; Lewis, JS; Hoertz, PG; Glass, JT; Parsons, GN, Atomic layer deposition for electrochemical energy generation and storage systems, Journal of vacuum science & technology. A, Vacuum, surfaces, and films : an official journal of the American Vacuum Society, vol 30 no. 1 (2012) [10.1116/1.3672027] [abs].
  • Raut, AS; Parker, CB; Stoner, BR; Glass, JT, Effect of porosity variation on the electrochemical behavior of vertically aligned multi-walled carbon nanotubes, Electrochemistry Communications, vol 19 no. 1 (2012), pp. 138-141 [10.1016/j.elecom.2012.03.021] [abs].
  • Stoner, BR; Glass, JT, Carbon nanostructures: A morphological classification for charge density optimization, Diamond and Related Materials, vol 23 (2012), pp. 130-134 [10.1016/j.diamond.2012.01.034] [abs].
  • Stoner, BR; Glass, JT, Nanoelectronics: Nothing is like a vacuum, Nature Nanotechnology, vol 7 no. 8 (2012), pp. 485-487 [10.1038/nnano.2012.130] [abs].
  • Brown, B; Parker, CB; Stoner, BR; Grill, WM; Glass, JT, Electrochemical charge storage properties of vertically aligned carbon nanotube films: The activation-enhanced length effect, Journal of the Electrochemical Society, vol 158 no. 12 (2011), pp. K217-K224 [10.1149/2.093112jes] [abs].
  • Brown, B; Parker, CB; Stoner, BR; Glass, JT, Growth of vertically aligned bamboo-like carbon nanotubes from ammonia/methane precursors using a platinum catalyst, Carbon, vol 49 no. 1 (2011), pp. 266-274 [10.1016/j.carbon.2010.09.018] [abs].
  • Evans-Nguyen, T; Parker, CB; Hammock, C; Monica, AH; Adams, E; Becker, L; Glass, JT; Cotter, RJ, Carbon nanotube electron ionization source for portable mass spectrometry, Analytical Chemistry, vol 83 no. 17 (2011), pp. 6527-6531 [10.1021/ac200643m] [abs].
  • Fissell, WH; Conlisk, AT; Datta, S; Magistrelli, JM; Glass, JT; Fleischman, AJ; Roy, S, High Knudsen number fluid flow at near-standard temperature and pressure conditions using precision nanochannels, Microfluidics and Nanofluidics, vol 10 no. 2 (2011), pp. 425-433 [10.1007/s10404-010-0682-4] [abs].
  • Stoner, BR; Piascik, JR; Gilchrist, KH; Parker, CB; Glass, JT, A bipolar vacuum microelectronic device, IEEE Transactions on Electron Devices, vol 58 no. 9 (2011), pp. 3189-3194 [10.1109/TED.2011.2157930] [abs].
  • Stoner, BR; Raut, AS; Brown, B; Parker, CB; Glass, JT, Graphenated carbon nanotubes for enhanced electrochemical double layer capacitor performance, Applied Physics Letters, vol 99 no. 18 (2011) [10.1063/1.3657514] [abs].
  • Natarajan, S; Parker, CB; Piascik, JR; Gilchrist, KH; Stoner, BR; Glass, JT, Analysis of 3-panel and 4-panel microscale ionization sources, Journal of Applied Physics, vol 107 no. 12 (2010) [10.1063/1.3429220] [abs].
  • Raut, AS; Parker, CB; Glass, JT, A method to obtain a Ragone plot for evaluation of carbon nanotube supercapacitor electrodes, Journal of materials research, vol 25 no. 8 (2010), pp. 1500-1506 [10.1557/jmr.2010.0192] [abs].
  • Wolter, SD; Brown, B; Parker, CB; Stoner, BR; Glass, JT, The effect of gold on platinum oxidation in homogeneous Au-Pt electrocatalysts, Applied Surface Science, vol 257 no. 5 (2010), pp. 1431-1436 [10.1016/j.apsusc.2010.08.062] [abs].
  • Ma, SY; Chen, HX; Glass, JT; Parker, CB; Li, Y, Influence of Al-doping and oxygen partial pressure on the optical properties of ZnO films, Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics - Technical Proceedings of the 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009, vol 1 (2009), pp. 273-276 [abs].
  • Natarajan, S; Gilchrist, KH; Piascik, JR; Parker, CB; Glass, JT; Stoner, BR, Simulation and testing of a lateral, microfabricated electron-impact ion source, Applied Physics Letters, vol 94 no. 4 (2009) [10.1063/1.3046733] [abs].
  • Russell, ZE; Russell, PE; Glass, JT; Parker, CB; Stoner, BR; Gilchrist, KH; Piascik, JR, Development of a micro mass spectrometer: Analysis of particle behavior in mems ion lens systems, Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol 15 no. SUPPL. 2 (2009), pp. 242-243 [10.1017/S1431927609098870] [abs].
  • Brown, B; Wolter, SD; Stoner, BR; Glass, JT, Alloying effects of cosputtered gold-platinum thin films on the oxygen reduction reaction in acidic electrolyte, Journal of the Electrochemical Society, vol 155 no. 8 (2008), pp. B852-B859 [10.1149/1.2939210] [abs].
  • Brown, B; Wolter, SD; Stoner, BR; Glass, JT, Alloying effects of co-sputtered gold-platinum thin films on the oxygen reduction reaction in acidic electrolyte, ECS Transactions, vol 11 no. 32 (2008), pp. 49-65 [10.1149/1.2992493] [abs].
  • Carlsson, B; Dumitriu, M; Glass, JT; Nard, CA; Barrett, R, Intellectual property (IP) management: Organizational processes and structures, and the role of IP donations, The Journal of Technology Transfer, vol 33 no. 6 (2008), pp. 549-559 [10.1007/s10961-008-9082-2] [abs].
  • Naskar, S; Wolter, SD; Bower, CA; Stoner, BR; Glass, JT, Effect of film chemistry on refractive index of plasma-enhanced chemical vapor deposited silicon oxynitride films: A correlative study, Journal of materials research, vol 23 no. 5 (2008), pp. 1433-1442 [10.1557/jmr.2008.0176] [abs].
  • Natarajan, S; Parker, CB; Glass, JT; Bower, CA; Gilchrist, KH; Piascik, JR; Stoner, BR, High voltage MEMS platform for fully integrated, on-chip, vacuum electronic devices, 2008 IEEE International Vacuum Electronics Conference, IVEC with 9th IEEE International Vacuum Electron Sources Conference, IVESC (2008), pp. 24-25 [10.1109/IVELEC.2008.4556325] [abs].
  • Natarajan, S; Parker, CB; Glass, JT; Piascik, JR; Gilchrist, KH; Bower, CA; Stoner, BR, High voltage microelectromechanical systems platform for fully integrated, on-chip, vacuum electronic devices, Applied Physics Letters, vol 92 no. 22 (2008) [10.1063/1.2938075] [abs].
  • Zhang, XD; Lewis, JS; Parker, CB; Glass, JT; Wolter, SD, Measurement of reactive and condensable gas permeation using a mass spectrometer, Journal of vacuum science & technology. A, Vacuum, surfaces, and films : an official journal of the American Vacuum Society, vol 26 no. 5 (2008), pp. 1128-1137 [10.1116/1.2952453] [abs].
  • Bower, CA; Gilchrist, KH; Piascik, JR; Stoner, BR; Natarajan, S; Parker, CB; Wolter, SD; Glass, JT, On-chip electron-impact ion source using carbon nanotube field emitters, Applied Physics Letters, vol 90 no. 12 (2007) [10.1063/1.2715457] [abs].
  • Evans, RD; Doll, GL; Meng, WJ; Mei, F; Glass, JT, Effects of applied substrate bias during reactive sputter deposition of nanocomposite tantalum carbide/amorphous hydrocarbon thin films, Thin Solid Films, vol 515 no. 13 (2007), pp. 5403-5410 [10.1016/j.tsf.2006.12.034] [abs].
  • Fissell, WH; Manley, S; Dubnisheva, A; Glass, J; Magistrelli, J; Eldridge, AN; Fleischman, AJ; Zydney, AL; Roy, S, Ficoll is not a rigid sphere, American journal of physiology. Renal physiology, vol 293 no. 4 (2007), pp. F1209-F1213 [10.1152/ajprenal.00097.2007] [abs].
  • Gilchrist, KH; Bower, CA; Lueck, MR; Piascik, JR; Stoner, BR; Natarajan, S; Parker, CB; Glass, JT, A novel ion source and detector for a miniature mass spectrometer, Proceedings of IEEE Sensors (2007), pp. 1372-1375 [10.1109/ICSENS.2007.4388667] [abs].
  • Youngsman, J; Marx, B; Wolter, S; Glass, J; Moll, A, Miniature multi-electrode electrochemical cell in LTCC, Journal of Microelectronics and Electronic Packaging, vol 4 no. 1 (2007), pp. 31-36 [abs].
  • Zhang, XD; Lewis, JS; Wolter, SD; Parker, CB; Glass, JT, High sensitivity permeation measurement system for "ultrabarrier" thin films, Journal of vacuum science & technology. A, Vacuum, surfaces, and films : an official journal of the American Vacuum Society, vol 25 no. 6 (2007), pp. 1587-1593 [10.1116/1.2794075] [abs].
  • Nemanich Robert, J; Glass Jeffrey, T, Proceedings of the joint 11th International Conference on New Diamond Science and Technology and the 9th Applied Diamond Conference, Research Triangle Park, North Carolina, 15-19 May 2006, Diamond and Related Materials, vol 15 no. 11-12 (2006), pp. VII-VII [abs].
  • Bower, CA; Gilchrist, KH; Broderick, S; Piascik, JR; Stoner, BR; Parker, CB; Natarajan, S; Wolter, SD; Glass, JT, High voltage compatible micromachined vacuum electronic devices with carbon nanotube cold cathodes, 2006 IEEE International Vacuum Electronics Conference held jointly with 2006 IEEE International Vacuum Electron Sources, IVEC/IVESC 2006 (2006), pp. 471-472 [abs].
  • Evans, RD; Doll, GL; Glass, JT, Mechanical property development in reactively sputtered tantalum carbide/amorphous hydrocarbon thin films, Journal of materials research, vol 21 no. 6 (2006), pp. 1500-1511 [10.1557/jmr.2006.0174] [abs].
  • Nemanich, RJ; Glass, JT, ICNDST & ADC 2006 presents latest research in diamond and related materials, MRS bulletin / Materials Research Society, vol 31 no. 9 (2006) [abs].
  • Youngsman, J; Marx, B; Schimpf, M; Wolter, S; Glass, J; Moll, A, Low temperature co-fired ceramics for micro-fluidics, Proceedings - Electronic Components and Technology Conference, vol 2006 (2006), pp. 699-704 [10.1109/ECTC.2006.1645733] [abs].
  • Youngsman, J; Marx, B; Wolter, S; Glass, J; Moll, A, Miniature multi-electrode electrochemical cell in LTCC, IMAPS/ACerS - 2nd International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies, CICMT 2006 (2006), pp. 249-252 [abs].
  • Evans, RD; Howe, JY; Bentley, J; Doll, GL; Glass, JT, Influence of deposition parameters on the composition and structure of reactively sputtered nanocomposite TaC/a-C:H thin films, Journal of materials research, vol 20 no. 9 (2005), pp. 2583-2596 [10.1557/JMR.2005.0324] [abs].
  • Naskar, S; Bower, CA; Weiter, SD; Stoner, BR; Glass, JT, Improved optical loss characteristics of PECVD silicon oxynitride films using low frequency plasma, Materials Research Society Symposium - Proceedings, vol 862 (2005), pp. 61-66 [abs].
  • Naskar, S; Bower, CA; Yadon, LN; Wolter, SD; Stoner, BR; Glass, JT, Effect of growth parameters on refractive index and film composition of plasma enhanced chemical vapor deposition silicon oxynitride films, Materials Research Society Symposium - Proceedings, vol 848 (2005), pp. 171-176 [abs].
  • Naskar, S; Wolter, SD; Bower, CA; Stoner, BR; Glass, JT, Verification of the O-Si-N complex in plasma-enhanced chemical vapor deposition silicon oxynitride films, Applied Physics Letters, vol 87 no. 26 (2005), pp. 1-3 [10.1063/1.2158022] [abs].
  • Yang, PC; Prater, JT; Liu, W; Glass, JT; Davis, RF, The formation of epitaxial hexagonal boron nitride on nickel substrates, Journal of Electronic Materials, vol 34 no. 12 (2005), pp. 1558-1564 [abs].
  • Evans, RD; Bentley, J; More, KL; Doll, GL; Glass, JT, Radial distribution function analyses of amorphous carbon thin films containing various levels of silicon and hydrogen, Journal of Applied Physics, vol 96 no. 1 (2004), pp. 273-279 [10.1063/1.1760232] [abs].
  • Holmes, JS; Glass, JT, Internal R&D - Vital but only one piece of the innovation puzzle, Research Technology Management, vol 47 no. 5 (2004), pp. 7-10 [abs].
  • Purswani, JM; Pons, AP; Glass, JT; Evans, RD; Cogdell, JD, Effects of annealing on the mechanical and electrical properties of DC sputtered tantalum pentoxide (Ta2O5) thin films, Materials Research Society Symposium - Proceedings, vol 811 (2004), pp. 63-68 [abs].
  • Glass, JT; Ensing, IM; DeSanctis, G, Managing the ties between central R & D and business units, Research Technology Management, vol 46 no. 1 (2003), pp. 24-31 [abs].
  • DeSanctis, G; Glass, JT; Ensing, IM, Organizational designs for R & D, Academy of Management Executive, vol 16 no. 3 (2002), pp. 55-66 [abs].
  • Evans, RD; Doll, GL; Jr, PWM; Bentley, J; More, KL; Glass, JT, The effects of structure, composition, and chemical bonding on the mechanical properties of Si-aC:H thin films, Surface and Coatings Technology, vol 157 no. 2-3 (2002), pp. 197-206 [10.1016/S0257-8972(02)00164-0] [abs].
  • Evans, RD; Doll, GL; Jr, PWM; Bentley, J; More, KL; Glass, JT, Relationships between the structural, chemical, and mechanical properties of Si-aC:H thin films, Materials Research Society Symposium - Proceedings, vol 697 (2002), pp. 261-270 [abs].
  • Evans, RD; Doll, GL; Glass, JT, Relationships between the thermal stability, friction, and wear properties of reactively sputtered Si-aC:H thin films, Journal of Materials Research, vol 17 no. 11 (2002), pp. 2888-2896 [abs].
  • Glass, JT; Fox, BA; Dreifus, DL; Stoner, BR, Diamond for electronics: Future prospects of diamond SAW devices, MRS Bulletin, vol 23 no. 9 (1998), pp. 49-55 [abs].
  • Angus, JC; Bachmann, PK; BuckleyGolder, I; Fukunaga, O; Glass, JT; Kamo, M, Preface to the proceedings of the 7th European Conference on Diamond, Diamond-like and Related Materials (Diamond Films '96), Tours, France, September 8-13, 1996, Diamond and Related Materials, vol 6 no. 2-4 (1997), pp. R11-R11 [abs].
  • Bachmann, PK; BuckleyGolder, I; Glass, JT; Kamo, M, Preface to the Proceedings of the 6th European Conference on Diamond, Diamond-like and Related Materials (Diamond Films '95), Barcelona, Spain, September 10-15, 1995, Diamond and Related Materials, vol 5 no. 3-5 (1996), pp. R15-R15 [abs].
  • Goeller, PT; Wang, Z; Sayers, DE; Glass, JT; Nemanich, RJ, Epitaxial films of cobalt disilicide (100) evaporated onto Si(100) from a mixed source, Materials Research Society Symposium - Proceedings, vol 402 (1996), pp. 511-516 [abs].
  • Liu, W; Yang, PC; Tucker, DA; Wolden, CA; Davis, RF; Glass, JT; Prater, JT; Sitar, Z, TEM analysis of the observed phases during the growth of oriented diamond on nickel substrates, Materials Research Society Symposium - Proceedings, vol 423 (1996), pp. 457-462 [abs].
  • Yang, PC; Liu, W; Tucker, DA; Wolden, CA; Davis, RF; Glass, JT; Prater, JT; Sitar, Z, Nucleation and growth of oriented diamond films on nickel substrates, Materials Research Society Symposium - Proceedings, vol 423 (1996), pp. 281-286 [abs].
  • ZHU, W; YANG, PC; GLASS, JT; AREZZO, F, DIAMOND NUCLEATION AND GROWTH ON REACTIVE TRANSITION-METAL SUBSTRATES, Journal of Materials Research, vol 10 no. 6 (1995), pp. 1455-1460 [abs].
  • BACHMANN, PK; BUCKLEYGOLDER, IM; GLASS, JT; KAMO, M, PREFACE TO THE PROCEEDINGS OF THE 5TH EUROPEAN CONFERENCE ON DIAMOND, DIAMOND-LIKE AND RELATED MATERIALS (DIAMOND-FILMS-94), IL-CIOCCO, ITALY, SEPTEMBER 25-30, 1994, Diamond and Related Materials, vol 4 no. 4 (1995), pp. R15-R15 [abs].
  • Bozeman, SP; Tucker, DA; Stoner, BR; Glass, JT; Hooke, WM, Diamond deposition using a planar radio frequency inductively coupled plasma, Applied Physics Letters (1995) [10.1063/1.113793] [abs].
  • Jr, PWM; Somashekhar, A; Glass, JT; Prater, JT, Growth of diamond films using an enclosed combustion flame, Journal of Applied Physics, vol 78 no. 6 (1995), pp. 4144-4156 [10.1063/1.359874] [abs].
  • Liu, J; Zhirnov, VV; Myers, AF; Wojak, GJ; Choi, WB; Hren, JJ; Wolter, SD; McClure, MT; Stoner, BR; Glass, JT, Field emission characteristics of diamond coated silicon field emitters, Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, vol 13 no. 2 (1995), pp. 422-426 [10.1116/1.587961] [abs].
  • Liu, W; Tucker, DA; Yang, P; Glass, JT, Nucleation of oriented diamond particles on cobalt substrates, Journal of Applied Physics, vol 78 no. 2 (1995), pp. 1291-1296 [10.1063/1.360768] [abs].
  • Tucker, DA; Seo, DK; Whangbo, MH; Sivazlian, FR; Stoner, BR; Bozeman, SP; Sowers, AT; Nemanich, RJ; Glass, JT, Comparison of silicon, nickel, and nickel silicide (Ni3Si) as substrates for epitaxial diamond growth, Surface Science, vol 334 no. 1-3 (1995), pp. 179-194 [abs].
  • Wolter, SD; Glass, JT; Stoner, BR, Investigation of the process factor space on bias-enhanced nucleation of diamond on silicon, Thin Solid Films, vol 261 no. 1-2 (1995), pp. 4-11 [abs].
  • Wolter, SD; Glass, JT; Stoner, BR, Bias induced diamond nucleation studies on refractory metal substrates, Journal of Applied Physics, vol 77 no. 10 (1995), pp. 5119-5124 [10.1063/1.359322] [abs].
  • Wolter, SD; McClure, MT; Glass, JT; Stoner, BR, Bias-enhanced nucleation of highly oriented diamond on titanium carbide (111) substrates, Applied Physics Letters, vol 66 no. 21 (1995) [10.1063/1.113483] [abs].
  • Wolter, SD; McClure, MT; Glass, JT; Stoner, BR, Bias-enhanced nucleation of highly oriented diamond on titanium carbide (111) substrates, Applied Physics Letters, vol 66 (1995) [abs].
  • Zhu, W; Sivazlian, FR; Stoner, BR; Glass, JT, Nucleation and selected area deposition of diamond by biased hot filament chemical vapor deposition, Journal of Materials Research, vol 10 no. 2 (1995), pp. 425-430 [abs].
  • BACHMANN, PK; BUCKLEYGOLDER, I; GLASS, JT; KAMO, M, PREFACE TO THE PROCEEDINGS OF THE 4TH EUROPEAN CONFERENCE ON DIAMOND, DIAMOND-LIKE AND RELATED MATERIALS (DIAMOND FILMS 93), ALBUFEIRA, PORTUGAL, SEPTEMBER 20-24, 1993, Diamond and Related Materials, vol 3 no. 4-6 (1994), pp. R15-R15 [abs].
  • Bergman, L; McClure, MT; Glass, JT; Nemanich, RJ, Origin of the broadband luminescence and the effect of nitrogen doping on the optical properties of diamond films, Journal of Applied Physics, vol 76 no. 5 (1994), pp. 3020-3027 [10.1063/1.357508] [abs].
  • Bergman, L; McClure, MT; Glass, JT; Nemanich, RJ, Recombination processes of the broadband and 1.681 eV optical centers in diamond films, Materials Research Society Symposium - Proceedings, vol 339 (1994), pp. 663-668 [abs].
  • Jr, PWM; Somashekhar, A; Glass, JT; Prater, JT, Nucleation enhancement and growth of diamond films using an enclosed combustion flame, Materials Research Society Symposium - Proceedings, vol 349 (1994), pp. 403-408 [abs].
  • Liu, J; Zhirnov, VV; Wojak, GJ; Myers, AF; Choi, WB; Hren, JJ; Wolter, SD; McClure, MT; Stoner, BR; Glass, JT, Electron emission from diamond coated silicon field emitters, Applied Physics Letters, vol 65 no. 22 (1994), pp. 2842-2844 [10.1063/1.112538] [abs].
  • McClure, MT; Windheim, JAV; Glass, JT; Prater, JT, Effect of native SiO2 layer on the nucleation of diamond using a combustion flame, Diamond and Related Materials, vol 3 no. 3 (1994), pp. 239-244 [abs].
  • Sivazlian, FR; Glass, JT; Stoner, BR, Investigation of the low angle grain boundaries in highly oriented diamond films via transmission electron microscopy, Journal of Materials Research, vol 9 no. 10 (1994), pp. 2487-2489 [abs].
  • Wolter, SD; Stoner, BR; Yang, PC; Lui, W; Glass, JT, Diamond nucleation studies on refractory metals and nickel, Materials Research Society Symposium - Proceedings, vol 339 (1994), pp. 291-296 [abs].
  • Wolter, SD; Stoner, BR; Glass, JT, The effect of substrate material on bias-enhanced diamond nucleation, Diamond and Related Materials, vol 3 no. 9 (1994), pp. 1188-1195 [abs].
  • Yang, PC; Zhu, W; Glass, JT, Diamond nucleation on nickel substrates seeded with non-diamond carbon, Journal of Materials Research, vol 9 no. 5 (1994), pp. 1063-1066 [abs].
  • Bade, JP; Sahaida, SR; Stoner, BR; Windheim, JAV; Glass, JT; Miyata, K; Nishimura, K; Kobashi, K, Fabrication of diamond thin-film thermistors for high-temperature applications, Diamond and Related Materials, vol 2 no. 5-7 (1993), pp. 816-819 [abs].
  • Bade, JP; Sahaida, SR; Stoner, BR; Windheim, JAV; Glass, JT; Miyata, K; Nishimura, K; Kobashi, K, Fabrication of diamond thin-film thermistors for high-temperature applications, Diamond and Related Materials, vol 2 no. 5 -7 pt 2 (1993), pp. 816-819 [abs].
  • Bergman, L; Stoner, BR; Turner, KF; Glass, JT; Nemanich, RJ, Microphotoluminescence and Raman scattering study of defect formation in diamond films, Journal of Applied Physics, vol 73 no. 8 (1993), pp. 3951-3957 [10.1063/1.352858] [abs].
  • Kohl, R; Wild, C; Herres, N; Koidl, P; Stoner, BR; Glass, JT, Oriented nucleation and growth of diamond films on β-SiC and Si, Applied Physics Letters, vol 63 no. 13 (1993), pp. 1792-1794 [10.1063/1.110664] [abs].
  • Stoner, BR; Ma, GH; Wolter, SD; Zhu, W; Wang, YC; Davis, RF; Glass, JT, Epitaxial nucleation of diamond on β-SiC via bias-enhanced microwave plasma chemical vapor deposition, Diamond and Related Materials, vol 2 no. 2-4 pt 1 (1993), pp. 142-146 [10.1016/0925-9635(93)90045-4] [abs].
  • Stoner, BR; Ma, GH; Wolter, SD; Zhu, W; Wang, YC; Davis, RF; Glass, JT, Epitaxial nucleation of diamond on β-SiC via bias-enhanced microwave plasma chemical vapor deposition, Diamond and Related Materials, vol 2 no. 2 -4 pt 1 (1993), pp. 142-146 [abs].
  • Tachibana, T; Glass, JT; Nemanich, RJ, Effect of surface hydrogen on metal-diamond interface properties, Journal of Applied Physics, vol 73 no. 2 (1993), pp. 835-842 [10.1063/1.353322] [abs].
  • Tachibana, T; Glass, JT; Thompson, DG, Titanium carbide rectifying contacts on boron-doped polycrystalline diamond, Diamond and Related Materials, vol 2 no. 1 (1993), pp. 37-40 [abs].
  • Tachibana, T; Glass, JT, Correlation of interface chemistry to electrical properties of metal contacts on diamond, Diamond and Related Materials, vol 2 no. 5-7 pt 2 (1993), pp. 963-969 [10.1016/0925-9635(93)90259-5] [abs].
  • Wang, XH; Zhu, W; Windheim, JV; Glass, JT, Combustion growth of large diamond crystals, Journal of Crystal Growth, vol 129 no. 1-2 (1993), pp. 45-55 [abs].
  • Windheim, JAV; Sivazlian, F; McClure, MT; Glass, JT; Prater, JT, Nucleation and growth of diamond using a computer-controlled oxy-acetylene torch, Diamond and Related Materials, vol 2 no. 2-4 (1993), pp. 438-442 [abs].
  • Windheim, JAV; Sivazlian, F; McClure, MT; Glass, JT; Prater, JT, Nucleation and growth of diamond using a computer-controlled oxy-acetylene torch, Diamond and Related Materials, vol 2 no. 2 -4 pt 1 (1993), pp. 438-442 [abs].
  • Wolter, SD; Stoner, BR; Glass, JT; Ellis, PJ; Buhaenko, DS; Jenkins, CE; Southworth, P, Textured growth of diamond on silicon via in situ carburization and bias-enhanced nucleation, Applied Physics Letters, vol 62 no. 11 (1993), pp. 1215-1217 [10.1063/1.108738] [abs].
  • Yang, PC; Zhu, W; Glass, JT, Nucleation of oriented diamond films on nickel substrates, Journal of Materials Research, vol 8 no. 8 (1993), pp. 1773-1776 [abs].
  • Zhu, W; Wang, XH; Stoner, BR; Kong, HS; Braun, MWH; Glass, JT, Geometric modeling of the diamond-β-SiC heteroepitaxial interface, Diamond and Related Materials, vol 2 no. 2-4 pt 1 (1993), pp. 590-596 [10.1016/0925-9635(93)90127-N] [abs].
  • Zhu, W; Wang, XH; Stoner, BR; Kong, HS; Braun, MWH; Glass, JT, Geometric modeling of the diamond-β-SiC heteroepitaxial interface, Diamond and Related Materials, vol 2 no. 2 -4 pt 1 (1993), pp. 590-596 [abs].
  • Zhu, W; Wang, XH; Stoner, BR; Ma, GHM; Kong, HS; Braun, MWH; Glass, JT, Diamond and β-SiC heteroepitaxial interfaces: A theoretical and experimental study, Physical Review B - Condensed Matter and Materials Physics, vol 47 no. 11 (1993), pp. 6529-6542 [10.1103/PhysRevB.47.6529] [abs].
  • Zhu, W; Yang, PC; Glass, JT, Oriented diamond films grown on nickel substrates, Applied Physics Letters, vol 63 no. 12 (1993), pp. 1640-1642 [10.1063/1.110721] [abs].
  • Angus, JC; Sunkara, M; Sahaida, SR; Glass, JT, Twinning and faceting in early stages of diamond growth by chemical vapor deposition, Journal of Materials Research, vol 7 no. 11 (1992), pp. 3001-3009 [abs].
  • Das, K; Venkatesan, V; Miyata, K; Dreifus, DL; Glass, JT, A review of the electrical characteristics of metal contacts on diamond, Thin Solid Films, vol 212 no. 1-2 (1992), pp. 19-24 [abs].
  • Stoner, BR; Glass, JT; Bergman, L; Nemanich, RJ; Zoltal, LD; Vandersande, JW; Stoner, BR; Glass, JT; Bergman, L; Nemanich, RJ; Zoltal, LD; Vandersande, JW, Electrical conductivity and photoluminescence of diamond films grown by downstream microwave plasma CVDElectrical conductivity and photoluminescence of diamond films grown by downstream microwave plasma CVD, Journal of Electronic Materials, vol 21 no. 6 (1992) [abs].
  • Stoner, BR; Ma, GHM; Wolter, SD; Glass, JT, Characterization of bias-enhanced nucleation of diamond on silicon by invacuo surface analysis and transmission electron microscopy, Physical Review B - Condensed Matter and Materials Physics, vol 45 no. 19 (1992), pp. 11067-11084 [10.1103/PhysRevB.45.11067] [abs].
  • Stoner, BR; Williams, BE; Wolter, SD; Nishimura, K; Glass, JT, In situ growth rate measurement and nucleation enhancement for microwave plasma CVD of diamond, Journal of Materials Research, vol 7 no. 2 (1992), pp. 257-260 [abs].
  • Stoner, BR; Glass, JT, Textured diamond growth on (100) β-SiC via microwave plasma chemical vapor deposition, Applied Physics Letters, vol 60 no. 6 (1992), pp. 698-700 [10.1063/1.106541] [abs].
  • Tachibana, T; Williams, BE; Glass, JT, Correlation of the electrical properties of metal contacts on diamond films with the chemical nature of the metal-diamond interface. I. Gold contacts: A non-carbide-forming metal, Physical Review B - Condensed Matter and Materials Physics, vol 45 no. 20 (1992), pp. 11968-11974 [10.1103/PhysRevB.45.11968] [abs].
  • Tachibana, T; Williams, BE; Glass, JT, Correlation of the electrical properties of metal contacts on diamond films with the chemical nature of the metal-diamond interface. II. Titanium contacts: A carbide-forming metal, Physical Review B - Condensed Matter and Materials Physics, vol 45 no. 20 (1992), pp. 11975-11981 [10.1103/PhysRevB.45.11975] [abs].
  • Tachibana, T; Glass, JT, Effects of argon presputtering on the formation of aluminum contacts on polycrystalline diamond, Journal of Applied Physics, vol 72 no. 12 (1992), pp. 5912-5918 [10.1063/1.351899] [abs].
  • Wang, XH; Ma, GHM; Zhu, W; Glass, JT; Bergman, L; Turner, KF; Nemanich, RJ, Effects of boron doping on the surface morphology and structural imperfections of diamond films, Diamond and Related Materials, vol 1 no. 7 (1992), pp. 828-835 [abs].
  • Williams, B; Glass, J; Davis, R, Defect and interface structures of diamond thin films, R and D: Research and Development Kobe Steel Engineering Reports, vol 42 no. 2 (1992), pp. 13-16 [abs].
  • Windheim, JAV; Glass, JT, Improved uniformity and selected area deposition of diamond by the oxy-acetylene flame method, Journal of Materials Research, vol 7 no. 8 (1992), pp. 2144-2150 [abs].
  • Williams, BE; Tachibana, T; Stoner, BR; Glass, JT, SURFACE AND MICROSTRUCTURAL CHARACTERIZATION OF THE NUCLEATION AND GROWTH OF DIAMOND THIN-FILMS, ACS National Meeting Book of Abstracts, vol 202 (1991), pp. 121-PHYS [abs].
  • Braun, MWH; Kong, HS; Glass, JT; Davis, RF, The role of geometric considerations in the diamond-cubic boron nitride heteroepitaxial system, Journal of Applied Physics, vol 69 no. 4 (1991), pp. 2679-2681 [10.1063/1.348663] [abs].
  • Das, K; Venkatesan, V; Miyata, K; Dreifus, DL; Glass, JT, Review of the electrical characteristics of metal contacts on diamond, Materials Science Monographs, vol 73 (1991) [abs].
  • Geis, MW; Smith, HI; Argoitia, A; Angus, J; Ma, GHM; Glass, JT; Butler, J; Robinson, CJ; Pryor, R, Large-area mosaic diamond films approaching single-crystal quality, Applied Physics Letters, vol 58 no. 22 (1991), pp. 2485-2487 [10.1063/1.104851] [abs].
  • Ma, GHM; Williams, BE; Glass, JT; Prater, JT, Analysis via transmission electron microscopy of the quality of diamond films deposited from the vapor phase, Diamond and Related Materials, vol 1 no. 1 (1991), pp. 25-32 [abs].
  • Miyauchi, S; Kumagai, K; Miyata, K; Nishimura, K; Kobashi, K; Nakaue, A; Glass, JT; Buckley-Golder, IM, Microfabrication of diamond films: selective deposition and etching, Surface and Coatings Technology, vol 47 no. 1-3 (1991), pp. 465-473 [abs].
  • Nishimura, K; Das, K; Glass, JT, Material and electrical characterization of polycrystalline boron-doped diamond films grown by microwave plasma chemical vapor deposition, Journal of Applied Physics, vol 69 no. 5 (1991), pp. 3142-3148 [10.1063/1.348582] [abs].
  • Turner, KF; LeGrice, YM; Stoner, BR; Glass, JT; Nemanich, RJ, Surface topography and nucleation of chemical vapor deposition diamond films on silicon by scanning tunneling microscopy, J. Vac. Sci. Technol. B, Microelectron. Process. Phenom. (USA), vol 9 no. 2 (1991), pp. 914-919 [10.1116/1.585494] [abs].
  • Turner, KF; Stoner, BR; Bergman, L; Glass, JT; Nemanich, RJ, Observation of surface modification and nucleation during deposition of diamond on silicon by scanning tunneling microscopy, Journal of Applied Physics, vol 69 no. 9 (1991), pp. 6400-6405 [10.1063/1.348843] [abs].
  • Zhu, W; Stoner, BR; Williams, BE; Glass, JT, Growth and characterization of diamond films on nondiamond substrates for electronic applications, Proceedings of the IEEE, vol 79 no. 5 (1991), pp. 621-646 [10.1109/5.90129] [abs].
  • Murphy, J; Glass, JT; Majerowicz, S; Green, RE, LASER INTERFEROMETRIC PROBE FOR DETECTION OF ACOUSTIC-EMISSION, Materials Evaluation, vol 48 no. 6 (1990), pp. 714-720 [abs].
  • Buckley-Golder, IM; Chalker, PR; Glass, JT; Kobashi, K; Nakaue, A, Determination of impurity dopant distributions in diamond films by SIMS, Carbon, vol 28 no. 6 (1990) [abs].
  • Kobashi, K; Nakaue, A; Glass, JT; Buckley-Golder, IM, Properties and applications of vapor grown diamond, Carbon, vol 28 no. 6 (1990), pp. 756-757 [abs].
  • Lee, YH; Bachmann, KJ; Glass, JT; LeGrice, YM; Nemanich, RJ, Vapor deposition of diamond thin films on various substrates, Applied Physics Letters, vol 57 no. 18 (1990), pp. 1916-1918 [10.1063/1.104011] [abs].
  • Lee, YH; Richard, PD; Bachmann, KJ; Glass, JT, Bias-controlled chemical vapor deposition of diamond thin films, Applied Physics Letters, vol 56 no. 7 (1990), pp. 620-622 [10.1063/1.102716] [abs].
  • Ma, GHM; Lee, YH; Glass, JT, Electron microscopic characterization of diamond films grown on Si by bias-controlled chemical vapor deposition, Journal of Materials Research, vol 5 no. 11 (1990), pp. 2367-2377 [abs].
  • More, KL; Hua, SK; Glass, JT; Davis, RF, Electron microscopy of defects in epitaxical β-SiC thin films grown on silicon and carbon {0001} faces of α-SiC substrates, Journal of the American Ceramic Society, vol 73 no. 5 (1990), pp. 1283-1288 [abs].
  • Shroder, RE; Nemanich, RJ; Glass, JT, Analysis of the composite structures in diamond thin films by Raman spectroscopy, Physical Review B - Condensed Matter and Materials Physics, vol 41 no. 6 (1990), pp. 3738-3745 [10.1103/PhysRevB.41.3738] [abs].
  • Williams, BE; Glass, JT; Davis Robert, F; Kobashi, K, Analysis of defect structures and substrate/film interfaces of diamond thin films, Journal of Crystal Growth, vol 99 no. 1-4 pt 2 (1990), pp. 1168-1176 [abs].
  • Williams, BE; Kong, HS; Glass, JT, Electron microscopy of vapor phase deposited diamond, Journal of Materials Research, vol 5 no. 4 (1990), pp. 801-810 [abs].
  • Yu, CW; Hua, SK; Glass, JT; Davis, RF; More, KL, Effect of substrate orientation on interfacial and bulk character of chemically vapor deposited monocrystalline silicon carbide thin films, Journal of the American Ceramic Society, vol 73 no. 5 (1990), pp. 1289-1296 [abs].
  • Glass, JT; Jr, GLC; Stoner, GE, Effect of phosphoric acid concentration on electrocatalysis, Journal of the Electrochemical Society, vol 136 no. 3 (1989), pp. 656-660 [abs].
  • Kong, HS; Glass, JT; Davis, RF, Growth rate, surface morphology, and defect microstructures of β-SiC films chemically vapor deposited on 6H-SiC substrates, Journal of Materials Research, vol 4 no. 1 (1989), pp. 204-214 [abs].
  • Ryu, J; Kim, HJ; Glass, JT; Davis, RF, The effects of thermal annealing on the microstructural, optical and electrical properties of beta silicon carbide films implanted with boron or nitrogen, Journal of Electronic Materials, vol 18 no. 2 (1989), pp. 157-165 [10.1007/BF02657402] [abs].
  • Williams, BE; Glass, JT; Davis, RF; Kobashi, K; More, KL, Microstructural characterization of diamond thin films, Proceedings - The Electrochemical Society, vol 89 no. 12 (1989) [abs].
  • Williams, BE; Glass, JT, Characterization of diamond thin films: Diamond phase identification, surface morphology, and defect structures, Journal of Materials Research, vol 4 no. 2 (1989), pp. 373-384 [abs].
  • Bumgarner, JW; Kong, HS; Kim, HJ; Palmour, JW; Edmond, JA; Glass, JT; Davis, RF, MONOCRYSTALLINE beta -SIC SEMICONDUCTOR THIN FILMS: EPITAXIAL GROWTH, DOPING, AND FET DEVICE DEVELOPMENT., Proceedings - Electronic Components and Technology Conference (1988), pp. 342-349 [abs].
  • Davis, RF; Sitar, Z; Williams, BE; Kong, HS; Kim, HJ; Palmour, JW; Edmond, JA; Ryu, J; Glass, JT; Carter, CHJ, Critical evaluation of the status of the areas for future research regarding the wide band gap semiconductors diamond, gallium nitride and silicon carbide, Materials Science & Engineering B: Solid-State Materials for Advanced Technology, vol B1 no. 1 (1988), pp. 77-104 [10.1016/0921-5107(88)90032-3] [abs].
  • Edmond, JA; Ryu, J; Glass, JT; Davis, RF, ELECTRICAL CONTACTS TO BETA SILICON CARBIDE THIN FILMS., Journal of the Electrochemical Society, vol 135 no. 2 (1988), pp. 359-362 [abs].
  • Glass, ; T, J; Cahen, ; L, G; Jr, , The electrochemical stability and calculated free energies of PtCr alloys, J. Electrochem. Soc. (USA), vol 135 no. 7 (1988), pp. 1650-1658 [abs].
  • Glass, JT; Williams, BE; Davis, RF, Chemical vapor deposition and characterization of diamond films grown via microwave plasma enhanced CVD, Proc. SPIE - Int. Soc. Opt. Eng. (USA), vol 877 (1988), pp. 56-63 [abs].
  • Kim, HJ; Kong, H; Edmond, JA; Ryu, J; Palmour, J; Jr, CCH; Glass, JT; Davis, RF, Epitaxial growth, doping, and analytical characterization of monocrystalline beta-SiC semiconductor thin films, J. Vac. Sci. Technol. A, Vac. Surf. Films (USA), vol 6 no. 3 (1988), pp. 1954-1956 [10.1116/1.575214] [abs].
  • Kong, HS; Glass, JT; Davis, RF, Chemical vapor deposition and characterization of 6H-SiC thin films on off-axis 6H-SiC substrates, Journal of Applied Physics, vol 64 no. 5 (1988), pp. 2672-2679 [10.1063/1.341608] [abs].
  • Kong, HS; Jiang, BL; Glass, JT; Rozgonyi, GA; More, KL, An examination of double positioning boundaries and interface misfit in beta-SiC films on alpha-SiC substrates, Journal of Applied Physics, vol 63 no. 8 (1988), pp. 2645-2650 [10.1063/1.341004] [abs].
  • Kong, HS; Wang, YC; Glass, JT; Davis, RF, The effect of off-axis Si (100) substrates on the defect structure and electrical properties of β-SiC thin films, J. Mater. Res. (USA), vol 3 no. 3 (1988), pp. 521-530 [abs].
  • Nemanich, RJ; Glass, JT; Lucovsky, G; Shroder, RE, Raman scattering characterization of carbon bonding in diamond and diamondlike thin films, J. Vac. Sci. Technol. A, Vac. Surf. Films (USA), vol 6 no. 3 (1988), pp. 1783-1787 [10.1116/1.575297] [abs].
  • Williams, BE; Glass, JT; Davis, RF; Kobashi, K; Horiuchi, T, Structural and chemical characterization of diamond films and diamond-substrate interfaces, J. Vac. Sci. Technol. A, Vac. Surf. Films (USA), vol 6 no. 3 (1988), pp. 1819-1820 [10.1116/1.575261] [abs].
  • Davis, RF; Kim, HJ; Kong, H; Edmond, JA; Glass, JT, EPITAXIAL-GROWTH, DOPING AND ANALYTICAL CHARACTERIZATION OF MONOCRYSTALLINE BETA-SIC SEMICONDUCTOR THIN-FILMS, Journal of Electronic Materials, vol 16 no. 4 (1987), pp. A23-A23 [abs].
  • Glass, JT; Jr, GLC; Stoner, GE, EFFECT OF METALLURGICAL VARIABLES ON THE ELECTROCATALYTIC PROPERTIES OF PtCr ALLOYS., Journal of the Electrochemical Society, vol 134 no. 1 (1987), pp. 58-65 [abs].
  • Kim, HJ; Edmond, JA; Ryu, J; Kong, H; Jr, CHC; Glass, JT; Davis, RF, Epitaxial growth, doping and analytical characterization of monocrystalline beta-SiC semiconductor thin flims, International SAMPE Symposium and Exhibition (Proceedings), vol 1 (1987), pp. 370-381 [abs].
  • Kong, HS; Palmour, JW; Glass, JT; Davis, RF, Temperature dependence of the current-voltage characteristics of metal-semiconductor field-effect transistors in n-type β-SiC grown via chemical vapor deposition, Applied Physics Letters, vol 51 no. 6 (1987), pp. 442-444 [10.1063/1.98416] [abs].
  • Glass, JT; Cahen, GL; Stoner, GE, DETERMINATION OF THE EFFECT OF METALLURGICAL VARIABLES ON THE ELECTROCATALYTIC PROPERTIES OF PTCR ALLOYS, Journal of the Electrochemical Society, vol 133 no. 3 (1986), pp. C120-C120 [abs].
  • Glass, JT; Jr, GLC; Stoner, GE, DETERMINATION OF THE EFFECT OF METALLURGICAL VARIABLES ON THE ELECTROCATALYTIC PROPERTIES AT PtCr ALLOYS., Proceedings - The Electrochemical Society, vol 86-10 (1986), pp. 231-256 [abs].
  • Kong, HS; Glass, JT; Davis, RF, Epitaxial growth of β-SiC thin films on 6H α-SiC substrates via chemical vapor deposition, Applied Physics Letters, vol 49 no. 17 (1986), pp. 1074-1076 [10.1063/1.97479] [abs].
  • Glass, JT; Green, RE, ACOUSTIC EMISSION DURING DEFORMATION AND FRACTURE OF THREE NAVAL ALLOY STEELS., Materials Evaluation, vol 43 no. 7 (1985), pp. 864-872 [abs].