Michael Gehm

Image of Michael Gehm

Associate Professor of Electrical and Computer Engineering

Appointments and Affiliations
  • Associate Professor of Electrical and Computer Engineering
Contact Information:
  • Office Phone: (919) 660-5544
  • Email Address: michael.gehm@duke.edu
Education:

  • Ph.D. Duke University, 2003
  • M.S. Duke University, 1998
  • B.S. Washington University, 1992

Awards, Honors, and Distinctions:

    Courses Taught:
    • BME 609: Optics and Photonics Seminar Series
    • ECE 270L: Introduction to Electromagnetic Fields
    • ECE 493: Undergraduate Research in Electrical and Computer Engineering
    • ECE 549: Optics and Photonics Seminar Series
    • ECE 590: Advanced Topics in Electrical and Computer Engineering
    • ECE 675: Optical Imaging and Spectroscopy
    • ECE 891: Internship
    • PHYSICS 549: Optics and Photonics Seminar Series

    Representative Publications: (More Publications)
      • Chen, EX; Russell, ZE; Amsden, JJ; Wolter, SD; Danell, RM; Parker, CB; Stoner, BR; Gehm, ME; Glass, JT; Brady, DJ, Order of Magnitude Signal Gain in Magnetic Sector Mass Spectrometry Via Aperture Coding., Journal of The American Society for Mass Spectrometry, vol 26 no. 9 (2015), pp. 1633-1640 [abs].
      • Tuo, M; Zhang, J; Liang, M; Ng, W-R; Gehm, M; Xin, H, THz photoconductive antenna array based near field imaging, International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013 (2015) [10.1109/IRMMW-THz.2015.7327576] [abs].
      • Gehm, ME; Brady, DJ, Compressive sensing in the EO/IR., Applied Optics, vol 54 no. 8 (2015), pp. C14-C22 [10.1364/ao.54.000c14] [abs].
      • Russell, ZE; Chen, EX; Amsden, JJ; Wolter, SD; Danell, RM; Parker, CB; Stoner, BR; Gehm, ME; Brady, DJ; Glass, JT, Two-dimensional aperture coding for magnetic sector mass spectrometry., Journal of The American Society for Mass Spectrometry, vol 26 no. 2 (2015), pp. 248-256 [abs].
      • Chen, EX; Gehm, M; Danell, R; Wells, M; Glass, JT; Brady, D, Compressive mass analysis on quadrupole ion trap systems., Journal of The American Society for Mass Spectrometry, vol 25 no. 7 (2014), pp. 1295-1304 [abs].