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Friday, March 25, 2022 – 8:00AM to 9:00AM
Daniel Limbrick, Associate Professor in the Electrical and Computer Engineering Department at North Carolina A&T
Integrated circuits have become more vulnerable to faults and errors such as those introduced by environmental factors, e.g., ionizing radiation and electrostatic, and cyberattacks, e.g., laser fault injection and rowhammer. For mission- and safety-critical applications, such faults can corrupt data and alter decision-making in ways that threaten human life. Additionally, the increasing complexity of integrated circuits makes it harder to understand the impact of faults. In this talk, I will discuss approaches to simulate random and malicious faults in microprocessors and show how this information can be used to mitigate their impact.
Dr. Daniel Limbrick is currently an Associate Professor in the Electrical and Computer Engineering Department at North Carolina Agricultural and Technical State University (NC A&T). As director of the Automated Design for Emerging Process Technologies (ADEPT) laboratory, Dr. Limbrick researches ways to make computers more reliable in harsh environments (i.e., radiation hardening, physical attacks) through design methods that span multiple levels of abstraction (i.e., architectural/microarchitectural description, circuit design, physical design). Additionally, Dr. Limbrick develops testbeds for digital systems (e.g., high-performance computing, Internet-of-things) to predict and solve challenges for future technologies.
Before joining NC A&T in Fall 2013, Dr. Limbrick received a PhD at Vanderbilt University and worked as a postdoctoral scholar at the Georgia Institute of Technology. He is currently a Department of the Navy Distinguished Fellow and has been awarded over $5,000,000 in research funding from the National Science Foundation, Air Force Office of Science and Research, Office of Naval Research, Naval Warfare Surface Center, National Nuclear Security Administration, and Sandia National Laboratory.