Professor of Electrical and Computer Engineering
Michael Gehm received a B.S. in Mechanical Engineering from Washington University in St. Louis in 1992. He earned his A.M. and Ph.D. degrees in Physics from Duke University in 1998 and 2003, respectively. From 2003–2005, he was a Research Associate in ECE at Duke, followed by a year as an Assistant Research Professor. In 2007 he was appointed an Assistant Professor of ECE and was jointly appointed an Assistant Professor of Optical Sciences in 2009. He was promoted to Associate Professor of ECE and Optical Sciences in 2013 before returning to Duke as an Associate Professor of ECE later that year. He added a secondary appointment in Physics in 2021. In 2022, he was promoted to Professor of ECE and Physics.
His current research interests are primarily computational and compressive sensing and measurement in all modalities (with special emphasis in Electromagnetic/Optical from RF to x-ray and all forms of Mass spectrometry), with side interests in optical physics, high-performance x-ray simulation, and rapid-prototyping as a means of creating advanced electromagnetic structures.
He is a Fellow of both Optica (formerly, OSA) and SPIE.
Appointments and Affiliations
- Professor of Electrical and Computer Engineering
- Associate Professor of Physics
Contact Information
- Office Location: 3463 CIEMAS, Fitzpatrick Center, Durham, NC 27708
- Office Phone: (919) 660-5544
- Email Address: michael.gehm@duke.edu
Education
- B.S. Washington University in St. Louis, 1992
- M.S. Duke University, 1998
- Ph.D. Duke University, 2003
Research Interests
Primarily computational and compressive sensing and measurement in all modalities (with special emphasis in Electromagnetic/Optical from RF to x-ray and all forms of Mass spectrometry), with side interests in optical physics, high-performance x-ray simulation, and rapid-prototyping as a means of creating advanced electromagnetic structures
Awards, Honors, and Distinctions
- Fellow. SPIE. 2022
- Fellow. Optica (formerly, OSA). 2020
Courses Taught
- ECE 270DL: Fields and Waves: Fundamentals of Information Propagation
- ECE 270L9: Fields and Waves: Fundamentals of Information Propagation (Lab)
- ECE 542: Holography and Coherent Imaging
- ECE 675: Optical Imaging and Spectroscopy
- ECE 899: Special Readings in Electrical Engineering
In the News
- A Speedier and More Accurate Future for Airport Security Screening (Feb 24, 2020 | Pratt School of Engineering)
- Duke to Lead $5.83 Million DHS Project to Reinvent Airport Screening (Dec 10, 2018 | Pratt School of Engineering)
- The Way This Image Is Created Sounds Like Magic (Sep 27, 2018 | Pratt School of Engineering)
Representative Publications
- Aloui, T., R. B. Serpa, N. Abboud, K. L. Horvath, J. Keogh, C. B. Parker, J. C. Stern, et al. “A super-resolution proof of concept in a cycloidal coded aperture miniature mass spectrometer.” Rapid Communications in Mass Spectrometry, January 1, 2023. https://doi.org/10.1002/rcm.9477.
- Coccarelli, D., C. Dudley, D. Pike, R. Greenberg, R. Moody, E. Franco, T. Richmond, A. J. Kapadia, M. E. Gehm, and J. A. Greenberg. “Performance of a high-throughput full-tunnel XRD checked baggage scanning system.” In Proceedings of SPIE - The International Society for Optical Engineering, Vol. 12531, 2023. https://doi.org/10.1117/12.2664253.
- Ruiz, S. D., A. X. Hurlock, S. Yang, M. Martinez, R. Thamvichai, J. A. Greenberg, A. Ashok, and M. E. Gehm. “Simulation and information-theoretic analysis of a hybrid CT+XRD imaging system.” In Proceedings of SPIE - The International Society for Optical Engineering, Vol. 12531, 2023. https://doi.org/10.1117/12.2664066.
- Hurlock, A. X., T. Koh, M. Martinez, and M. E. Gehm. “Spectrally Responsive Edge Illumination X-ray Phase Contrast Imaging (XPCI).” In Proceedings of SPIE - The International Society for Optical Engineering, Vol. 12531, 2023. https://doi.org/10.1117/12.2663798.
- Ruiz, S. D., M. Martinez, and M. E. Gehm. “Asymmetric Illumination X-Ray Differential Phase Contrast Imaging.” In Proceedings of SPIE - The International Society for Optical Engineering, Vol. 12531, 2023. https://doi.org/10.1117/12.2663925.