Michael E. Gehm

Professor of Electrical and Computer Engineering

Appointments and Affiliations

  • Professor of Electrical and Computer Engineering
  • Associate Professor of Physics

Contact Information

  • Office Location: 3463 CIEMAS, Fitzpatrick Center, Durham, NC 27708
  • Office Phone: (919) 660-5544
  • Email Address: michael.gehm@duke.edu

Education

  • B.S. Washington University in St. Louis, 1992
  • M.S. Duke University, 1998
  • Ph.D. Duke University, 2003

Research Interests

Primarily computational and compressive sensing and measurement in all modalities (with special emphasis in Electromagnetic/Optical from RF to x-ray and all forms of Mass spectrometry), with side interests in optical physics, high-performance x-ray simulation, and rapid-prototyping as a means of creating advanced electromagnetic structures

Awards, Honors, and Distinctions

  • Fellow. OSA (The Optical Society). 2020

Courses Taught

  • ECE 270DL: Fields and Waves: Fundamentals of Information Propagation
  • ECE 270L9: Fields and Waves: Fundamentals of Information Propagation (Lab)
  • ECE 392: Projects in Electrical and Computer Engineering
  • ECE 494: Projects in Electrical and Computer Engineering
  • ECE 590: Advanced Topics in Electrical and Computer Engineering
  • ECE 675: Optical Imaging and Spectroscopy
  • ECE 899: Special Readings in Electrical Engineering

In the News

Representative Publications

  • Horvath, Kathleen L., Elettra L. Piacentino, Rafael Bento Serpa, Tanouir Aloui, Raul Vyas, Yuriy Zhilichev, Jesko von Windheim, et al. “Design considerations for a cycloidal mass analyzer using a focal plane array detector.” Journal of Mass Spectrometry : Jms 57, no. 7 (July 2022): e4874. https://doi.org/10.1002/jms.4874.
  • Ruiz, S. D., Z. W. Gude, A. X. Hurlock, K. Ferguson, C. Miller, J. H. Carpenter, J. A. Greenberg, and M. E. Gehm. “Characterization of photon counting detectors for x-ray diffraction (XRD) applications.” In Proceedings of Spie  the International Society for Optical Engineering, Vol. 12104, 2022. https://doi.org/10.1117/12.2618954.
  • Hurlock, A. X., S. D. Ruiz, J. H. Carpenter, J. A. Greenberg, and M. E. Gehm. “Spectrally responsive edge-illumination (SREI) x-ray phase contrast imaging (XPCI).” In Proceedings of Spie  the International Society for Optical Engineering, Vol. 12104, 2022. https://doi.org/10.1117/12.2618827.
  • Piacentino, Elettra L., Rafael Bento Serpa, Kathleen L. Horvath, Raul Vyas, Tanouir Aloui, Charles B. Parker, James B. Carlson, et al. “The Long Neglected Cycloidal Mass Analyzer.” Analytical Chemistry 93, no. 33 (August 2021): 11357–63. https://doi.org/10.1021/acs.analchem.1c02001.
  • Vyas, Raul, Tanouir Aloui, Kathleen Horvath, Philip J. Herr, Matthew P. Kirley, Charles B. Parker, Adam D. Keil, et al. “Improving the Performance of a Cycloidal Coded-Aperture Miniature Mass Spectrometer.” Journal of the American Society for Mass Spectrometry 32, no. 2 (February 2021): 509–18. https://doi.org/10.1021/jasms.0c00378.