Joel Alter Greenberg

Associate Research Professor in the Department of Electrical and Computer Engineering

Dr. Greenberg's research is in the area of computational imaging with a focus on physics-based modeling and system-level design from fundamental science through algorithm implementation.  His work spans the electromagnetic spectrum, with a focus on X-ray and visible imaging and detection systems for security and medical applications.  

Appointments and Affiliations

  • Associate Research Professor in the Department of Electrical and Computer Engineering

Contact Information

  • Office Location: Box 90291, Dept of Ece, Durham, NC 27708
  • Office Phone: (919) 660-0183
  • Email Address: joel.greenberg@duke.edu
  • Websites:

Education

  • Ph.D. Duke University, 2012

Research Interests

Computational sensing with a focus on novel, physics-based measurement techniques for practical applications.  Primarily focused in the electromagnetic/optical spectrum ranging from ELF through visible and hard X-rays, with applications to security, non-destructive testing, and medical imaging.  Investigations range from basic science (e.g. fundamental studies in material science, optics, and information science) to applied and transitional work (e.g. design and implementation of architectures at the system level targeted at particular, real-world problems)

Courses Taught

  • ECE 493: Projects in Electrical and Computer Engineering

In the News

Representative Publications

  • Gude, Z., A. J. Kapadia, and J. A. Greenberg. “3D x-ray diffraction imaging of optically thin samples.” In Proceedings of Spie  the International Society for Optical Engineering, Vol. 12104, 2022. https://doi.org/10.1117/12.2618938.
  • Ruiz, S. D., Z. W. Gude, A. X. Hurlock, K. Ferguson, C. Miller, J. H. Carpenter, J. A. Greenberg, and M. E. Gehm. “Characterization of photon counting detectors for x-ray diffraction (XRD) applications.” In Proceedings of Spie  the International Society for Optical Engineering, Vol. 12104, 2022. https://doi.org/10.1117/12.2618954.
  • Hurlock, A. X., S. D. Ruiz, J. H. Carpenter, J. A. Greenberg, and M. E. Gehm. “Spectrally responsive edge-illumination (SREI) x-ray phase contrast imaging (XPCI).” In Proceedings of Spie  the International Society for Optical Engineering, Vol. 12104, 2022. https://doi.org/10.1117/12.2618827.
  • Stryker, Stefan, Anuj J. Kapadia, and Joel A. Greenberg. “Application of machine learning classifiers to X-ray diffraction imaging with medically relevant phantoms.” Medical Physics 49, no. 1 (January 2022): 532–46. https://doi.org/10.1002/mp.15366.
  • Stryker, Stefan, Joel A. Greenberg, Shannon J. McCall, and Anuj J. Kapadia. “X-ray fan beam coded aperture transmission and diffraction imaging for fast material analysis.” Sci Rep 11, no. 1 (May 19, 2021): 10585. https://doi.org/10.1038/s41598-021-90163-0.