Joel Alter Greenberg

Greenberg

Assistant Research Professor in the Department of Electrical and Computer Engineering

Dr. Greenberg's research is in the area of computational imaging with a focus on physics-based modeling and system-level design from fundamental science through algorithm implementation.  His work spans the electromagnetic spectrum, with a focus on X-ray and visible imaging and detection systems for security and medical applications.  

Appointments and Affiliations

  • Assistant Research Professor in the Department of Electrical and Computer Engineering

Contact Information

  • Office Location: Box 90291, Dept Of Ece, Durham, NC 27708
  • Office Phone: (919) 660-0183
  • Email Address: joel.greenberg@duke.edu
  • Websites:

Education

  • Ph.D. Duke University, 2012

Courses Taught

  • ECE 391: Projects in Electrical and Computer Engineering
  • ECE 493: Projects in Electrical and Computer Engineering
  • ECE 494: Projects in Electrical and Computer Engineering
  • ECE 899: Special Readings in Electrical Engineering

In the News

Representative Publications

  • Li, X; Stevens, A; Greenberg, JA; Gehm, ME, Single-shot memory-effect video., Scientific Reports, vol 8 no. 1 (2018) [10.1038/s41598-018-31697-8] [abs].
  • Zhu, Z; Katsevich, A; Kapadia, AJ; Greenberg, JA; Pang, S, X-ray diffraction tomography with limited projection information., Scientific Reports, vol 8 no. 1 (2018) [10.1038/s41598-017-19089-w] [abs].
  • Coccarelli, D; Greenberg, JA; Thamvichai, R; Voris, J; Masoudi, A; Ashok, A; Gehm, M, An information theoretic approach to system optimization accounting for material variability, Smart Structures and Materials 2005: Active Materials: Behavior and Mechanics, vol 10632 (2018) [10.1117/12.2305227] [abs].
  • Zhao, B; Wolter, S; Greenberg, JA, Application of machine learning to X-ray diffraction-based classification, Smart Structures and Materials 2005: Active Materials: Behavior and Mechanics, vol 10632 (2018) [10.1117/12.2304683] [abs].
  • Diallo, SO; Tadlock, K; Gregory, C; Wolter, S; Greenberg, JA; Roe, K, Towards an X-ray-based coded aperture diffraction system for bulk material identification, Smart Structures and Materials 2005: Active Materials: Behavior and Mechanics, vol 10632 (2018) [10.1117/12.2302513] [abs].